Sample Prep Workshop Using Leica UC Enuity

Join JH Technologies and Leica for a hands-on technical workshop focused on best practices for TEM, SEM, and AFM sample preparation using the Leica Enuity Ultramicrotome.

The workshop will combine expert instruction, demonstrations, and hands-on sample preparation. Attendees will explore techniques including ultra-thin sectioning, block-face preparation, cryo-sectioning, and failure analysis, with opportunities to evaluate prepared samples using optical microscopy and SEM imaging.

Attendance is limited to 3–5 participants per session to provide an interactive, hands-on experience.

What You'll Learn

TEM Sample Preparation

Learn techniques for creating ultra-thin, uniform sections suitable for Transmission Electron Microscopy.

Block-Face Imaging

Explore trimming and preparation techniques for creating smooth, flat surfaces for SEM, AFM, and optical microscopy.

Cryo-Sectioning

Learn how cryogenic sectioning can be used to prepare soft materials such as polymers, coatings, and elastomers.

Failure Analysis

Explore sectioning techniques for multilayer materials and composites to evaluate adhesion, layer thickness, and internal structural defects.

Leica Enuity Ultramicrotome

Attendees will have the opportunity to work with the Leica Enuity Ultramicrotome, including its cryo-sectioning capability.

JH Technologies will also have optical microscopy and SEM capabilities available for imaging and evaluating prepared samples.

Industry Experts

Helmut Gnaegi, Managing Director, Diatome Diamond Knives

Helmut Gnaegi is a renowned expert in ultramicrotomy and sectioning and will lead workshop instruction and demonstrations.

Seth Villarreal , Leica Microscopy expert and workshop speaker.

Sample Preparation

Do you have a sample you'd like to have sectioned?

Attendees may submit samples for consideration during the workshop.

Potential sample types include:

• Polymers
• Powders
• Paper
• Soft electronics

Sample requirements, shipping instructions, and deadlines will be provided to registered attendees.

Sample Contact

Micah Harrel
JH Technologies
mharrel@jhtechnologies.com

Why Ultramicrotomy?

Ultramicrotomy offers several advantages for materials characterization and sample preparation:

Reduced Thermal and Ion Damage
Ultramicrotomy does not rely on high-energy ion beams, reducing the risk of ion-related contamination and heat-induced damage.

Large Sample Areas
Ultramicrotomy can produce relatively large, homogeneous, uniformly thin sections compared with localized FIB-prepared areas.

Speed & Cost Efficiency
Once a sample is properly mounted or embedded, multiple sequential sections can be produced efficiently.

Workshop Schedule

I'd put this fairly high on the Eventbrite page because people will want to know exactly what they're signing up for.

Tuesday–Thursday

Morning Session: 9:00 AM–12:00 PM
Afternoon Session: 1:00 PM–4:00 PM

Friday

Morning Session: 9:00 AM–12:00 PM

Each session will include approximately 30 minutes of technical instruction, followed by demonstrations and hands-on activities.

Limited to 5 participants per session.

Who Should Attend?

This workshop is designed for professionals and researchers working with microscopy, materials characterization, sample preparation, and failure analysis, particularly those interested in TEM, SEM, AFM, and ultramicrotomy techniques.

Relevant Applications Include:

• Materials characterization
• Failure analysis
• Electron microscopy
• Polymer and coating analysis
• Multilayer material analysis
• SEM/TEM sample preparation
• AFM sample preparation